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Charge trapping instabilities in SiO2/InP MIS structures.

Authors

KANG KWANG NHAM; Lee Jung Il; 최병두; KIM CHOONG HWAN; 임한조; Han Il Ki

Citation

한국 물리학회 학술발표회 , 국방과학 연구소, pp.?

Keywords

InP MIS structures

URI

https://pubs.kist.re.kr/handle/201004/112456

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KIST Conference Paper > Others

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