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Issue DateTitleAuthor(s)
2024-08Unveiling the high-temperature degradation mechanism of solid oxide electrolysis cells through direct imaging of nanoscale interfacial phenomenaChoi, Haneul; Shin, Jisu; Yeon, Changho; Park, Sun-Young; Bae, Shin-Tae; Kim, Ji Wan; Lee, Jong-Ho; Park, Jin-Woo; Lee, Chan-Woo; Yoon, Kyung Joong; Chang, Hye Jung
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