Unveiling the high-temperature degradation mechanism of solid oxide electrolysis cells through direct imaging of nanoscale interfacial phenomena

Authors
Choi, HaneulShin, JisuYeon, ChanghoPark, Sun-YoungBae, Shin-TaeKim, Ji WanLee, Jong-HoPark, Jin-WooLee, Chan-WooYoon, Kyung JoongChang, Hye Jung
Issue Date
2024-08
Publisher
Royal Society of Chemistry
Citation
Energy & Environmental Science, v.17, no.15, pp.5410 - 5420
Abstract
Solid oxide electrolysis cell (SOEC) technology potentially offers the most efficient means of clean H2 production. Currently, the most critical issue is the delamination of the air electrode, but its fundamental cause has long been elusive. Using cutting-edge transmission electron microscopy techniques and density functional theory calculations, we reveal nanometer-scale interfacial degradation phenomena occurring in the early stages, clarifying the entire process of delamination and the origin thereof. During SOEC operation, oxygen ions accumulate at specific locations where they cannot be released as a gas. The annihilation of oxygen vacancies modifies the unit cell structure, causing anisotropic lattice strain; further injection of excess oxygen ions creates dislocations and segmented subgrains. Subsequently, these ions initiate the formation of nanopores, which eventually develop into cracks and delaminate the electrode. These previously undiscovered structural alterations contradict the long-held but unsubstantiated notion of gas pressure build-up, providing novel guidance for future development. Advanced transmission electron microscopy analysis uncovers the fundamental mechanisms behind nanometer-scale interfacial degradation phenomena in high-temperature solid oxide electrolysis cells.
Keywords
RADIATION; NONSTOICHIOMETRY; DELAMINATION; AIR ELECTRODE; YTTRIA-STABILIZED ZIRCONIA; ENERGY; HYDROGEN-PRODUCTION; OXYGEN ELECTRODES; IONIC-CONDUCTIVITY; CRYSTAL-STRUCTURE
ISSN
1754-5692
URI
https://pubs.kist.re.kr/handle/201004/150015
DOI
10.1039/d4ee00896k
Appears in Collections:
KIST Article > 2024
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE