1998-12 | A molecular dynamics study on the liquid-amorphous-crystalline transition in a Lennard-Jonesian FCC system: I. Bulk crystal | Chang, HK; Kim, SG; Cheong, B; Kim, WM; Chung, M; Lee, TS; Lee, JK |
1998-12 | A molecular dynamics study on the liquid-amorphous-crystalline transition in a Lennard-Jonesian FCC system: II. Nanocrystalline plates | Chang, HK; Kim, SG; Cheong, B; Kim, WM; Chung, M; Lee, TS; Lee, JK |
2005-04-01 | A semiconducting thermooptic material for potential application to super-resolution optical data storage | Lee, HS; Cheong, B; Lee, TS; Lee, KS; Kim, WM; Huh, JY |
2000-06 | Analysis of read-out signals in land/groove recording of a phase-change optical disc | Chung, M; Chung, KM; Lee, TS; Cheong, BK; Kim, WM; Song, KB; Kim, YD; Kim, SG |
2000-12 | Atomic-layer chemical-vapor-deposition of TiN thin films on Si(100) and Si(111) | Kim, YS; Jeon, H; Kim, Young Do; Kim, WM |
2002-01 | Comparison of TiN and TiAlN as a diffusion barrier deposited by atomic layer deposition | Kim, JY; Kim, HK; Kim, Y; Kim, YD; Kim, WM; Jeon, H |
2000-09 | Determination of optical constants of thin films from measurements of reflectance and transmittance | Bie, QS; Cheong, BK; Chung, MK; Lin, ZS; Lee, TS; Kim, WM; Kim, SG |
2005-08-01 | Dielectric confinement and surface plasmon damping in Au: Semiconductor nanocomposite thin films | Lee, KS; Kim, IH; Lee, TS; Cheong, B; Park, JG; Ha, JG; Kim, WM |
1997-10-13 | Edge detection in phase-change optical data storage | Peng, CB; Mansuripur, M; Kim, WM; Kim, SG |
1995-12-01 | Effect of ion irradiation on internal stress of amorphic carbon films produced by pulsed laser | Kim, WM; Lee, SK; Cheong, B; Kim, SG; Kim, OS; Ro, JS |
2006-01-03 | Effects of ZnO addition on electrical and structural properties of amorphous SnO2 thin films | Ko, JH; Kim, IH; Kim, D; Lee, KS; Lee, TS; Jeong, JH; Cheong, B; Baik, YJ; Kim, WM |
2005-07 | Electrical, optical and structural properties of transparent and conducting ZnO thin films doped with Al and F by rf magnetron sputter | Choi, BG; Kim, IH; Kim, DH; Lee, KS; Lee, TS; Cheong, B; Baik, YJ; Kim, WM |
2004-01-30 | Growth behavior and optical properties of metal-nanoparticle dispersed dielectric thin films formed by alternating sputtering | Cho, SH; Lee, S; Ku, DY; Lee, TS; Cheong, B; Kim, WM; Lee, KS |
2000-11 | Mechanical and adhesion properties of Al/AlN multilayered thin films | Lee, JH; Kim, WM; Lee, TS; Chung, MK; Cheong, BK; Kim, SG |
2002-11 | Metalorganic atomic layer deposition of TiN thin films using TDMAT and NH3 | Kim, HK; Kim, JY; Park, JY; Kim, Y; Kim, YD; Jeon, H; Kim, WM |
1996-10-15 | Optical and magneto-optical properties of NdTbFeCo thin films | Peng, CB; Kim, WM; Cheong, BK; Lee, SK; Kim, SG |
1997-10-31 | Optical and mechanical properties of amorphous CN films | Lee, S; Park, SJ; Oh, SG; Kim, WM; Bae, JH; Cheong, BK; Kim, SG |
2000-12-01 | Optical properties of Au nanocluster embedded dielectric films | Cho, S; Lee, S; Oh, SG; Park, SJ; Kim, WM; Cheong, BK; Chung, M; Song, KB; Lee, TS; Kim, SG |
2005-01 | Optical properties of Au nanoparticle dispersed (Ba,Sr)TiO3 thin films | Lee, KS; Lee, TS; Kim, IH; Cheong, B; Kim, WM |
2003-07 | Properties of Co-deposited indium tin oxide and zinc oxide films using a bipolar pulse power supply and a dual magnetron sputter source | Hwang, MS; Jeong, HS; Kim, WM; Seo, YW |
2005-03-22 | Spectro-ellipsometric studies of Au/SiO2 nanocomposite films | Cho, S; Lim, H; Lee, KS; Lee, TS; Cheong, B; Kim, WM; Lee, S |
2005-02-14 | The electromagnetic interference shielding effect of indium-zinc oxide/silver alloy multilayered thin films | Kim, WM; Ku, DY; Lee, IK; Seo, YW; Cheong, BK; Lee, TS; Kim, IH; Lee, KS |
2004-10-04 | Thermoelectric PbTe thin film for superresolution optical data storage | Lee, HS; Cheong, BK; Lee, TS; Lee, KS; Kim, WM; Lee, JW; Cho, SH; Huh, JY |
2002-05-06 | Thin film alloy mixtures for high speed phase change optical storage: A study on (Ge1Sb2Te4)(1-x)(Sn1Bi2Te4)(x) | Lee, TY; Kim, KB; Cheong, BK; Lee, TS; Park, SJ; Lee, KS; Kim, WM; Kim, SG |
2005-12-19 | Time-resolved analysis of the set process in an electrical phase-change memory device | Kang, DH; Cheong, B; Jeong, J; Lee, TS; Kim, IH; Kim, WM; Huh, JY |