2008-07-01 | Dependence of the stored charges and tunneling voltages on the tunneling SiO2 thickness for Si nanoparticles embedded in a SiO2 layer | Oh, Do-Hyun; Lee, Soojin; Cho, Woon-Jo; Kim, Tae Whan |
2008-02 | Effects of a H2SO4-treatment on the optical properties in porous Si layers and electrical properties of diode devices fabricated with a H2SO4 treated porous Si layer | Oh, Do-Hyun; Kim, Tae Whan; Cho, Woon-Jo; Kwack, Kae Dal |
2007-08 | Effects of hydrogenation and aging on the optical properties in porous Si layers | Oh, Do-Hyun; Lee, Soojin; Cho, Woon-Jo; Kim, Tae Whan |
2007-06 | Electron and hole storage in a floating gate consisting of Si nanocrystals embedded in a SiO2 layer | Oh, Do-Hyun; Lee, Soojin; Cho, Woon-Jo; Kim, Jae-Ho; Kim, Tae Whan |
2010-05 | Enhancement of the Memory Effects for Nonvolatile Memory Devices Fabricated Utilizing ZnO Nanoparticles Embedded in a Si3N4 Layer | Oh, Do-Hyun; Cho, Woon-Jo; Son, Dong Ick; Kim, Tae Whan |
2007-10-15 | Macroscopic and microscopic charging effects of Si nanocrystals embedded in a SiO2 layer | Kim, Jae-Ho; Oh, Do-Hyun; Lee, Soo-Jin; Lee, Kyu-Hwan; Cho, Woon-Jo; Kim, Tae Whan; Park, Young Ju |
2009-03 | Optical properties of ZnO nanoparticles embedded in a silicon nitride layer formed by sputtering and thermal treatment | Oh, Do-Hyun; Cho, Woon-Jo; Kim, Tae Whan |