Showing results 1 to 1 of 1
Issue Date | Title | Author(s) |
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2019-11 | A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology | Ximenes, Augusto Ronchini; Padmanabhan, Preethi; Lee, Myung-Jae; Yamashita, Yuichiro; Yaung, Dun-Nian; Charbon, Edoardo |