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Issue DateTitleAuthor(s)
1994-11DC BIASED CAPACITANCE METHOD FOR MEASURING THIN-FILM MAGNETOSTRICTION AND DELTA-EPSILON-EFFECTLEE, YH; SHIN, YD; HERR, PH; LEE, KH; KIM, HJ; HAN, SH; KANG, IK; RHEE, JR
1

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