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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
1999-05-15The characteristics of interfacial strains developed in silicon by wet O-2 oxidationShin, DW; You, YH; Choi, DJ; Kim, GH
1999-06-01The stacking faults and their strain effect at the Si/SiO2 interfaces of a directly bonded SOI (silicon on insulator)Shin, DW; Choi, DJ; Kim, GH
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