Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
---|---|---|
- | In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs | Dae-Young Jeon; Tim Baldauf; So Jeong Park; Sebastian Pregl; Larysa Baraban; Gianaurelio Cuniberti; Thomas Mikolajick; Walter M. Weber |
- | Less surface roughness scattering effects in highly doped Si-channel and ambipolar conduction behavior with Schottky-barrier contacts | Dae-Young Jeon; So Jeong Park; Gyu-Tae Kim; Gerard Ghibaudo; Sebastian Pregl; Thomas Mikolajick; Walter M. Weber |