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Less surface roughness scattering effects in highly doped Si-channel and ambipolar conduction behavior with Schottky-barrier contacts

Authors

Dae-Young Jeon; So Jeong Park; Gyu-Tae Kim; Gerard Ghibaudo; Sebastian Pregl; Thomas Mikolajick; Walter M. Weber

Publisher

6.12~15, 중국

Citation

ICASS2017

Keywords

Scattering; Junctionless transistors; ambipolar conduction; Schottky-barrier; I-V maps

URI

https://pubs.kist.re.kr/handle/201004/87663

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KIST Conference Paper > Others

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