2023-11 | Acoustic microscopy characterization of highly-ordered anodized nanoporous alumina films for nanotechnology applications | Dubey, Pooja; Declercq, Nico F.; Zhai, Min; Locquet, Alexandre; Jung, Mi; Woo, Deokha; Citrin, D. S. |
2020-07 | Characterization of nanoporous Al2O3 films at terahertz frequencies | Zhai, Min; Locquet, A.; Jung, Mi; Woo, Deokha; Citrin, D. S. |
2021 | Characterization of nanoporous alumina using terahertz reflectometry and scattering imaging | Zhai, Min; Locquet, A.; Jung, Mi; Woo, Deokha; Citrin, D. S. |
2012-07 | Enhanced Light Output from the Nano-Patterned InP Semiconductor Substrate Through the Nanoporous Alumina Mask | Jung, Mi; Kim, Jae Hun; Lee, Seok; Jang, Byung Jin; Lee, Woo Young; Oh, Yoo-Mi; Park, Sun-Woo; Woo, Deokha |
2014-07-07 | Enhancement of hole injection and electroluminescence by ordered Ag nanodot array on indium tin oxide anode in organic light emitting diode | Jung, Mi; Yoon, Dang Mo; Kim, Miyoung; Kim, Chulki; Lee, Taikjin; Kim, Jae Hun; Lee, Seok; Lim, Si-Hyung; Woo, Deokha |
2016-08 | Localized surface plasmon resonance in two-dimensional silver nanodot array fabricated using nanoporous alumina mask for chemical sensor platform | Jung, Mi; Ji, Myung-Gi; Kim, Tae-Ryong; Shim, Cheol-Hwee; Lee, Seok; Woo, Deokha; Choi, Young-Wan |
2016-01-04 | Manual, In situ, Real-Time Nanofabrication using Cracking through Indentation | Nam, Koo Hyun; Suh, Young D.; Yeo, Junyeob; Woo, Deokha |
2007-07 | Nanohole arrays with sub-30 nm diameter formed on GaAs using nanoporous alumina mask | Jung, Mi; Lee, Seok; Jhon, Young Min; Mho, Sun-il; Cho, Jae-won; Woo, Deokha |
2021-02 | Nondestructive characterization of nanoporous alumina films using terahertz scattering imaging | Zhai, Min; Locquet, A.; Jung, Mi; Woo, Deokha; Citrin, D. S. |
2014-04 | Plasmonic Properties of Metal Nanodot Arrays with Same Diameter utilizing Nanoporous Alumina Mask | Jung, Mi; Kim, Chulki; Woo, Deokha; Kim, Jae Hun; Lee, Seok; Lee, Taikjin |
2011-04 | Study of the Interaction Between Biomolecule Mono layers Using Total Internal Reflection Ellipsometry | Jung, Yong Woo; Yoon, Jae Jin; Kim, Young Dong; Woo, Deokha |