Browsing bySubjectnoise measurement

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Issue DateTitleAuthor(s)
2019-02On the Low-Frequency Noise Characterization of Z(2)-FET DevicesMarquez, Carlos; Navarro, Carlos; Navarro, Santiago; Padilla, Jose L.; Donetti, Luca; Sampedro, Carlos; Galy, Philippe; Kim, Yong-Tae; Gamiz, Francisco

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