2003-11-15 | Electrocatalytic reforming of carbon dioxide by methane in SOFC system | Moon, DJ; Ryu, JW |
2003-09-01 | Origin of residual stress in the formation of boron nitride film by sputtering with Ar ions | Kim, HS; Park, JK; Baik, YJ; Choi, IH |
2003-06 | Effect of structural properties on electrical properties of lanthanum oxide thin film as a gate dielectric | Jun, JH; Choi, DJ; Kim, KH; Oh, KY; Hwang, CJ |
2003-06 | Influence of intentionally strained sapphire substrate on GaN epilayers | Kim, J; Park, YJ; Byun, D; Jhin, J; Kang, M; Koh, EK; Moon, Y; Min, SK |
2003-05-15 | Surface alloy formation of Co on Al surface: Molecular dynamics simulation | Kim, SP; Chung, YC; Lee, SC; Lee, KR; Lee, KH |
2003-10 | The pronounced grain size refinement at the edge position of the diamond-coated WC-Co inserts under microwave plasma with negative bias | PARK, JONG KEUK; Lee, Wook Seong; Baik, Young Joon; Chae, KW |
2003-11 | Imaging the high-speed impact of microdrop on solid surface | Kim, HY; Park, SY; Min, K |
2003-03 | Spreading and solidification of a molten microdrop in the solder jet bumping process | Yang, YS; Kim, HY; Chun, JH |