Evaluation of acceptor binding energy of nitrogen doped ZnO thin films grown by dielectric barrier discharge in pulsed laser deposition

Authors
Lee Deuk-HeeChun Yoon SooPark ki hoSangsig KimLee Sang Yeol
Citation
Changchun 2010, pp.236
URI
https://pubs.kist.re.kr/handle/201004/100154
Appears in Collections:
KIST Conference Paper > Others
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