Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Youngsoo, Kim | - |
dc.contributor.author | Kang-Jin Kim | - |
dc.contributor.author | LEE, YEON HEE | - |
dc.date.accessioned | 2024-01-13T03:04:00Z | - |
dc.date.available | 2024-01-13T03:04:00Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/101899 | - |
dc.language | English | - |
dc.subject | fluorine | - |
dc.subject | plasma polymerization | - |
dc.subject | ICP | - |
dc.subject | CCP | - |
dc.subject | XPS | - |
dc.subject | TOF-SIMS | - |
dc.title | Analysis of fluorine-containing thin films using surface techniques | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | The 9th Asian conference on analytical sciences, pp.266 | - |
dc.citation.title | The 9th Asian conference on analytical sciences | - |
dc.citation.startPage | 266 | - |
dc.citation.conferencePlace | KO | - |
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