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Effect of grain orientation on oxide scale formation in SOFC interconnect material

Authors

Phaniraj Madakashira; Kim Dong-Ik; SHIM, JAE-HYEOK; Cho, Young Whan

Citation

7th International Conference on the Microscopy of Oxidation

Keywords

Oxidation; SOFC; stainless steel

URI

https://pubs.kist.re.kr/handle/201004/102110

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KIST Conference Paper > Others

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