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Nano-Channel Topography for Reduction of Adhesive and Friction Forces

Authors

R. Arvind Singh; PHAM DUC CUONG; Yoon, Eui Sung; Hoon-Eui Jeong; Kahp Y. Suh

Citation

International Conference on Metllurgical Coatings and Thin Films, pp.30

Keywords

Tribology; nano; micro; friction; adhesion; AFM

URI

https://pubs.kist.re.kr/handle/201004/103453

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KIST Conference Paper > Others

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