Full metadata record

DC Field Value Language
dc.contributor.authorKim, Seong Il-
dc.contributor.authorKang Gil Bum-
dc.contributor.authorKim, Yong Tae-
dc.contributor.authorLee Chang Woo-
dc.date.accessioned2024-01-13T06:03:33Z-
dc.date.available2024-01-13T06:03:33Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/103475-
dc.languageEnglish-
dc.subjectDiblock Copolymer-
dc.subjectCopolymerLithography-
dc.subjectReactive Ion Etching-
dc.subjectNanotemplate-
dc.titleControlling the Different Size of Nanoscale Holes-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationThe International Conference on Electrical Engineering 2007-
dc.citation.titleThe International Conference on Electrical Engineering 2007-
dc.citation.conferencePlaceHK-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE