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dc.contributor.authorDae-Hwan Kang-
dc.contributor.authorKim Inho-
dc.contributor.authorJeung-hyun Jeong-
dc.contributor.authorCHEONG, BYUNG KI-
dc.contributor.authorDong-Ho Ahn-
dc.contributor.authorDongbok Lee-
dc.contributor.authorHyun-Mi Kim-
dc.contributor.authorKi-Bum Kim-
dc.date.accessioned2024-01-13T07:03:22Z-
dc.date.available2024-01-13T07:03:22Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/103999-
dc.languageEnglish-
dc.subjectphase change memory-
dc.subjectswitching reliability-
dc.subjectoxidized TiN-
dc.subjectTiN electrode-
dc.titleInvestigation on the enhanced switching reliability of a non-volatile phase-change memory device with an oxidized TiN electrode-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationMRS 2006 spring meeting-
dc.citation.titleMRS 2006 spring meeting-
dc.citation.conferencePlaceUS-
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