Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Yong Tae | - |
| dc.contributor.author | Park Yu Jin | - |
| dc.contributor.author | Lee Jeong Yong | - |
| dc.contributor.author | Kim, Seong Il | - |
| dc.contributor.author | Kim, Young Hwan | - |
| dc.contributor.author | Akihiro Wakahara | - |
| dc.date.accessioned | 2024-01-13T07:32:46Z | - |
| dc.date.available | 2024-01-13T07:32:46Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/104211 | - |
| dc.language | English | - |
| dc.subject | Ge2Sb2Te5 | - |
| dc.subject | grain growth | - |
| dc.title | In situ transmission electron microscopy study on the nucleation and grain growth of Ge2Sb2Te5 thin films | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | International Conference on Electrical Engineering (ICEE) 2006 | - |
| dc.citation.title | International Conference on Electrical Engineering (ICEE) 2006 | - |
| dc.citation.conferencePlace | KO | - |
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