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In situ transmission electron microscopy study on the nucleation and grain growth of Ge2Sb2Te5 thin films

Authors

Kim, Yong Tae; Park Yu Jin; Lee Jeong Yong; Kim, Seong Il; Kim, Young Hwan; Akihiro Wakahara

Citation

International Conference on Electrical Engineering (ICEE) 2006

Keywords

Ge2Sb2Te5; grain growth

URI

https://pubs.kist.re.kr/handle/201004/104211

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KIST Conference Paper > Others

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