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Fast-Fourier Transform method to identify the high resolution transmission electron microscopy images of GST thin films

Authors

Kim, Yong Tae; Park Yu Jin; Jeong Yong Lee

Citation

2005 Korea-Japan joint workshop on advanced semiconductor processes and equipments

Keywords

GST; TEM

URI

https://pubs.kist.re.kr/handle/201004/104768

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KIST Conference Paper > Others

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