DSpace at KIST: Measurement of complex permittivity of thin PCB substrate using open-ended coaxial probe

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DC Field	Value	Language
dc.contributor.author	Jung Ji-Hyun	-
dc.contributor.author	조유선	-
dc.contributor.author	Kim, Se Yun	-
dc.date.accessioned	2024-01-13T09:04:04Z	-
dc.date.available	2024-01-13T09:04:04Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/105086	-
dc.language	English	-
dc.subject	프로브	-
dc.subject	유전율	-
dc.subject	PCB	-
dc.subject	null	-
dc.subject	null	-
dc.subject	probe	-
dc.subject	permittivity	-
dc.subject	PCB	-
dc.title	Measurement of complex permittivity of thin PCB substrate using open-ended coaxial probe	-
dc.type	Conference	-
dc.description.journalClass	1	-
dc.identifier.bibliographicCitation	Korea-Japan Joint Conference on AP/EMC/EMT, pp.155 - 158	-
dc.citation.title	Korea-Japan Joint Conference on AP/EMC/EMT	-
dc.citation.startPage	155	-
dc.citation.endPage	158	-
dc.citation.conferencePlace	KO	-

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