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Optimum condition and characterization of antireflection(AR) coating with ultralow reflectivity for semiconductor optical devices

Other Titles

반도체 광소자를 위한 극저 반사율을 갖는 무반사 코팅의 최적 조건 및 특성

Authors

Jeon Haeng Leam; Choi Jae Won; Byun, Young Tae; Jhon, Young Min; Kim, Sun Ho; 송석호

Citation

PC04 Photonics Confernece 2004

URI

https://pubs.kist.re.kr/handle/201004/105403

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KIST Conference Paper > Others

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