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dc.contributor.authorKim, Yong Tae-
dc.contributor.authorKIM IK SOO-
dc.contributor.authorKim, Seong Il-
dc.contributor.authorDong Chul Yoo-
dc.contributor.authorIn-Hoon Choi-
dc.date.accessioned2024-01-13T10:03:14Z-
dc.date.available2024-01-13T10:03:14Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/105563-
dc.languageEnglish-
dc.titleIdentification of hydrogen-induced changes in atomic deformation of ferroelectric SrBi2Nb2O9 thin film using transmission electron microscopy-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationInternational Conference on Electroceramics-
dc.citation.titleInternational Conference on Electroceramics-
dc.citation.conferencePlaceFR-
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