DSpace at KISTKIST Conference PaperOthers

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dc.contributor.author김한기-
dc.contributor.author0-
dc.contributor.author전은정-
dc.contributor.authorCho Won Il-
dc.contributor.authorYoon Young Soo-
dc.date.accessioned2024-01-13T13:32:55Z-
dc.date.available2024-01-13T13:32:55Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/107406-
dc.languageEnglish-
dc.titleTransmission electron microscopy (TEM) study of the degradation mechanism of amorphous vanadium oxide based thin film battery-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation2001 Joint International Meeting Abstract (Journal of the Electrochemical Society), v.148, no.4, pp.#37-
dc.citation.title2001 Joint International Meeting Abstract (Journal of the Electrochemical Society)-
dc.citation.volume148-
dc.citation.number4-
dc.citation.startPage#37-
dc.citation.endPage#37-
dc.citation.conferencePlaceUS-
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