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Structure analysis of tetrahedral amorphous carbon films using synchrotron radiation light source

Authors

이철승; EUN KWANG YONG; Lee Kwang Ryeol; Ki-Hyun Yoon; E. Gullickson; H. Padmore

Citation

Proceedings of the Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conferen, pp.522

Keywords

near edge x-ray absorption fine structure

URI

https://pubs.kist.re.kr/handle/201004/107491

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KIST Conference Paper > Others

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