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Optical study of InAs quantum dots and wetting layer using spectroscopic ellipsometry

Authors

이호선; Park Young Ju; KIM EUN KYU

Citation

The 8th Kor. Conf. on Semicon., pp.731 - 732

Keywords

ellipsometry; InAs quantum dots; wetting layer

URI

https://pubs.kist.re.kr/handle/201004/107891

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KIST Conference Paper > Others

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