Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim Yong Tae | - |
| dc.contributor.author | Kim Seong Il | - |
| dc.contributor.author | 최인훈 | - |
| dc.contributor.author | 최훈상 | - |
| dc.contributor.author | 이창우 | - |
| dc.date.accessioned | 2024-01-13T15:00:33Z | - |
| dc.date.available | 2024-01-13T15:00:33Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/108052 | - |
| dc.language | English | - |
| dc.subject | NDRO-FRAM | - |
| dc.title | EL-MoM5 effects of Bi/Sr stoichiometric ratio on electrical properties of Pt/SrBi2Nb2O9/Si ferroelectric gate structure | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | 2001 AVS 48th International Symposium, pp.7 | - |
| dc.citation.title | 2001 AVS 48th International Symposium | - |
| dc.citation.startPage | 7 | - |
| dc.citation.endPage | 7 | - |
| dc.citation.conferencePlace | US | - |
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