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Analysis of domain structures of ferroelectric thin films by synchrotron x-ray

Authors

LEE KYEONG SEOK; 김용관; 이길호; 백성기

Citation

2000 International Nano Crystals/Ceramics Forum and International Symposium on Intermaterials

Keywords

domain structure; ferroelectric thin film; synchrotron X-ray diffraction; FEM

URI

https://pubs.kist.re.kr/handle/201004/108372

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KIST Conference Paper > Others

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