Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE KYEONG SEOK | - |
| dc.contributor.author | 백성기 | - |
| dc.date.accessioned | 2024-01-13T16:00:53Z | - |
| dc.date.available | 2024-01-13T16:00:53Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/108612 | - |
| dc.language | English | - |
| dc.subject | microstructure characterization | - |
| dc.subject | synchrotron x-ray diffraction | - |
| dc.subject | epitaxial PZT thin films | - |
| dc.title | Characterization of domain structures in epitaxial PZT thin films using synchrotron XRD | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | The 12th International Symposium on Integrated Ferroelectrics | - |
| dc.citation.title | The 12th International Symposium on Integrated Ferroelectrics | - |
| dc.citation.conferencePlace | GW | - |
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