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dc.contributor.authorLEE KYEONG SEOK-
dc.contributor.author백성기-
dc.date.accessioned2024-01-13T16:01:01Z-
dc.date.available2024-01-13T16:01:01Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/108620-
dc.languageEnglish-
dc.subjectdomain formation-
dc.subjectsynchrotron x-ray diffraction-
dc.subjectepitaxial PZT thin film-
dc.subjectreciprocal space mapping-
dc.titleStructural characterization of ferroelectric domain formation in epitaxial PZT thin films by two-dimensional reciprocal space mapping using synchrotron x-ray diffraction-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationProceedings of the 12th Synchrotron Radiation User Workshop, pp.199 - 201-
dc.citation.titleProceedings of the 12th Synchrotron Radiation User Workshop-
dc.citation.startPage199-
dc.citation.endPage201-
dc.citation.conferencePlaceKO-
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