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Structural characterization of ferroelectric domain formation in epitaxial PZT thin films by two-dimensional reciprocal space mapping using synchrotron x-ray diffraction

Authors

LEE KYEONG SEOK; 백성기

Citation

Proceedings of the 12th Synchrotron Radiation User Workshop, pp.199 - 201

Keywords

domain formation; synchrotron x-ray diffraction; epitaxial PZT thin film; reciprocal space mapping

URI

https://pubs.kist.re.kr/handle/201004/108620

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KIST Conference Paper > Others

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