DSpace at KISTKIST Conference PaperOthers

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dc.contributor.authorSung-Kyun Lee-
dc.contributor.authorKim Yong Tae-
dc.contributor.authorKIM CHUN KEUN-
dc.contributor.authorKim Seong Il-
dc.contributor.author이철의-
dc.date.accessioned2024-01-13T16:04:37Z-
dc.date.available2024-01-13T16:04:37Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/108842-
dc.languageEnglish-
dc.subjectferroelectric gate-
dc.subjectmemory window-
dc.titleEffect of thickness of ferroelectrics and insulators on the memory window of ferroelectric gate capacitors-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationBulletin of the Korean Physical Society 2000. 10.-
dc.citation.titleBulletin of the Korean Physical Society 2000. 10.-
dc.citation.conferencePlaceKO-
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