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Effect of thickness of ferroelectrics and insulators on the memory window of ferroelectric gate capacitors

Authors

Sung-Kyun Lee; Kim Yong Tae; KIM CHUN KEUN; Kim Seong Il; 이철의

Citation

Bulletin of the Korean Physical Society 2000. 10.

Keywords

ferroelectric gate; memory window

URI

https://pubs.kist.re.kr/handle/201004/108842

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KIST Conference Paper > Others

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