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The changes of the properties of Pt/SrBi2Ta2O9/Pt capacitors and Pt/SrBi2Ta2O9/CeO2/Si structures by post-annealing and their origin

Authors

신동석; 최훈상; Ho Nyung Lee; Kim Yong Tae; PARK YOUNG KYUN; 최인훈

Citation

The 3rd Korea-Japan Conference on Ferroelectrics, pp.15

Keywords

post-annealing; Pt/SBT interface; Bi-Pt alloy

URI

https://pubs.kist.re.kr/handle/201004/109174

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KIST Conference Paper > Others

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