DSpace at KIST: Development of feature-based intelligent inspection planning system for CMM

Full metadata record

DC Field	Value	Language
dc.contributor.author	Ha Sung Do	-
dc.contributor.author	HWANG IN-SHIK	-
dc.date.accessioned	2024-01-13T17:02:27Z	-
dc.date.available	2024-01-13T17:02:27Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/109241	-
dc.language	English	-
dc.subject	검사 계획	-
dc.title	Development of feature-based intelligent inspection planning system for CMM	-
dc.title.alternative	CMM 을 이용한 특징형상 기반 지능형 검사계획 시스템 개발	-
dc.type	Conference	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	한국정밀공학회 '99 년도 춘계학술대회논문집, pp.1086 - 1091	-
dc.citation.title	한국정밀공학회 '99 년도 춘계학술대회논문집	-
dc.citation.startPage	1086	-
dc.citation.endPage	1091	-
dc.citation.conferencePlace	KO	-

Show Simple Item Record

KIST Library Institutional Repository