DSpace at KIST: Atomic force microscopy study and absorption properties of epitaxial AlxGa1-xN

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DC Field	Value	Language
dc.contributor.author	Jewon Kim	-
dc.contributor.author	최인훈	-
dc.contributor.author	PARK YOUNG KYUN	-
dc.contributor.author	Kim Yong Tae	-
dc.contributor.author	O. Ambacher	-
dc.contributor.author	M. Stutzmann	-
dc.date.accessioned	2024-01-13T17:04:14Z	-
dc.date.available	2024-01-13T17:04:14Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/109355	-
dc.language	English	-
dc.subject	AFM	-
dc.subject	AlGaN	-
dc.subject	Absorptiom Properties	-
dc.title	Atomic force microscopy study and absorption properties of epitaxial AlxGa1-xN	-
dc.type	Conference	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	한국물리학회회보 : 제75회 총회프로그램, 논문초록집, v.17, no.1, pp.218	-
dc.citation.title	한국물리학회회보 : 제75회 총회프로그램, 논문초록집	-
dc.citation.volume	17	-
dc.citation.number	1	-
dc.citation.startPage	218	-
dc.citation.endPage	218	-
dc.citation.conferencePlace	KO	-

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