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Atomic force microscopy study and absorption properties of epitaxial AlxGa1-xN

Authors

Jewon Kim; 최인훈; PARK YOUNG KYUN; Kim Yong Tae; O. Ambacher; M. Stutzmann

Citation

한국물리학회회보 : 제75회 총회프로그램, 논문초록집, v.17, no.1, pp.218

Keywords

AFM; AlGaN; Absorptiom Properties

URI

https://pubs.kist.re.kr/handle/201004/109355

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KIST Conference Paper > Others

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