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dc.contributor.authorJu Byeong Kwon-
dc.contributor.authorSHIN KYEONG SIK-
dc.contributor.authorOH MYUNG HWAN-
dc.contributor.authorLEE YUN HI-
dc.date.accessioned2024-01-13T17:32:16Z-
dc.date.available2024-01-13T17:32:16Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/109498-
dc.languageEnglish-
dc.subjectELD-
dc.titleInterfacial barrier for the electronic conduction in SrS:Cu, Cl Thin films-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIC-STDP'1999-
dc.citation.titleIC-STDP'1999-
dc.citation.conferencePlaceUS-

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