KIST Library Institutional Repository

Surface analysis for polymeric materials using TOF-SIMS.

Authors

LEE YEON HEE; HAN SEUNG HEE; 윤정현; LIM HYUN EUI; SUH MOO JIN

Citation

1st International Meeting on SIMS, pp.25 - 28

Keywords

TOF-SIMS; PSII; modification; surface

URI

https://pubs.kist.re.kr/handle/201004/109801

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML