DSpace at KIST: Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects

Full metadata record

DC Field	Value	Language
dc.contributor.author	Vaibhav K. Andleigh	-
dc.contributor.author	PARK YOUNG JOON	-
dc.contributor.author	Carl V. Thompson	-
dc.date.accessioned	2024-01-13T18:30:31Z	-
dc.date.available	2024-01-13T18:30:31Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/109924	-
dc.language	English	-
dc.subject	electromigration	-
dc.subject	Simulation	-
dc.subject	stress evolution	-
dc.title	Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects	-
dc.type	Conference	-
dc.description.journalClass	1	-
dc.identifier.bibliographicCitation	SRC TechCon '98 conference proceedings, Las Vegas, Nevada, Sep. 9-14, 1998, Symposium 8.4, pp.1 - 4	-
dc.citation.title	SRC TechCon '98 conference proceedings, Las Vegas, Nevada, Sep. 9-14, 1998, Symposium 8.4	-
dc.citation.startPage	1	-
dc.citation.endPage	4	-
dc.citation.conferencePlace	US	-

Show Simple Item Record

KIST Library Institutional Repository