Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE KYEONG SEOK | - |
| dc.contributor.author | 백성기 | - |
| dc.date.accessioned | 2024-01-13T18:31:13Z | - |
| dc.date.available | 2024-01-13T18:31:13Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/109971 | - |
| dc.language | English | - |
| dc.subject | domain structure | - |
| dc.subject | PZT | - |
| dc.subject | strain relaxation | - |
| dc.subject | x-ray diffraction | - |
| dc.title | Structural characterization of epitaxial PLZT thin films | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | Proceedings of the 3rd DIM-CISEM Joint Seminar, Tokyo, Japan, August 6-7, 1998., pp.1 - 9 | - |
| dc.citation.title | Proceedings of the 3rd DIM-CISEM Joint Seminar, Tokyo, Japan, August 6-7, 1998. | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 9 | - |
| dc.citation.conferencePlace | JA | - |
- Appears in Collections:
- KIST Conference Paper > Others
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