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dc.contributor.authorKIM YOUNG SIK-
dc.contributor.authorLEE YUN HI-
dc.contributor.authorJu Byeong Kwon-
dc.contributor.authorOH MYUNG HWAN-
dc.contributor.author성만영-
dc.contributor.author신동기-
dc.date.accessioned2024-01-13T18:33:52Z-
dc.date.available2024-01-13T18:33:52Z-
dc.date.created2021-09-29-
dc.identifier.issn0098-0966-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/110133-
dc.languageEnglish-
dc.subjectelectroluminescent display(ELD)-
dc.titleAn improved understanding of the relationship between interface roughness of ZnS:Pr,Ce phosphor-Ta//2O//5 insulating film and electrical characteristics of TFEL devices-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationProc. SID '98, pp.659 - 662-
dc.citation.titleProc. SID '98-
dc.citation.startPage659-
dc.citation.endPage662-
dc.citation.conferencePlaceUS-
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