DSpace at KISTKIST Conference PaperOthers

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dc.contributor.author고의관-
dc.contributor.authorC.S. Park-
dc.contributor.author박일우-
dc.contributor.authorPark Young Ju-
dc.contributor.authorKIM EUN KYU-
dc.contributor.author조성호-
dc.date.accessioned2024-01-13T19:02:10Z-
dc.date.available2024-01-13T19:02:10Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/110292-
dc.languageEnglish-
dc.subjectGaN-
dc.titleStudy of crystallographical defects of the GaN micro-crystals by Raman spectroscopy and X-ray diffraction-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationThe 9th Seoul International Symposium on the Physics of Semiconductors and Applications - 1998, pp.125 - 126-
dc.citation.titleThe 9th Seoul International Symposium on the Physics of Semiconductors and Applications - 1998-
dc.citation.startPage125-
dc.citation.endPage126-
dc.citation.conferencePlaceKO-
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