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Auger electron microscopy study of AlGaN grown by molecular beam epitaxy

Authors

Jewon Kim; SON CHANG-SIK; PARK YOUNG KYUN; Kim Yong Tae; 최인훈

Citation

한국물리학회 회보 = Bulletin of the Korean Physical Society, v.16, no.2, pp.470 - 471

Keywords

Auger Electron Microscopy; AlGaN; Gallium Nitride; molecular beam epitaxy

URI

https://pubs.kist.re.kr/handle/201004/110438

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KIST Conference Paper > Others

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