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dc.contributor.authorLEE KYEONG SEOK-
dc.contributor.author강영민-
dc.contributor.author백성기-
dc.date.accessioned2024-01-13T19:33:57Z-
dc.date.available2024-01-13T19:33:57Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/110682-
dc.languageEnglish-
dc.subjectdomain evolution-
dc.subjectferroelectric thin film-
dc.subjectsynchrotron X-ray diffraction-
dc.titleIn-situ analysis on domain evolution of epitaxial PLT, PZT thin films using synchrotron XRD-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationThe 9th International Meeting on Ferroelectricity, Seoul, Korea, August 24-29, 1997., pp.?-
dc.citation.titleThe 9th International Meeting on Ferroelectricity, Seoul, Korea, August 24-29, 1997.-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceKO-
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