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In-situ analysis on domain evolution of epitaxial PLT, PZT thin films using synchrotron XRD

Authors

LEE KYEONG SEOK; 강영민; 백성기

Citation

The 9th International Meeting on Ferroelectricity, Seoul, Korea, August 24-29, 1997., pp.?

Keywords

domain evolution; ferroelectric thin film; synchrotron X-ray diffraction

URI

https://pubs.kist.re.kr/handle/201004/110682

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KIST Conference Paper > Others

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