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dc.contributor.authorKim Yong Tae-
dc.contributor.authorHo Nyung Lee-
dc.contributor.author임명호-
dc.contributor.author조성호-
dc.date.accessioned2024-01-13T19:34:13Z-
dc.date.available2024-01-13T19:34:13Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/110697-
dc.languageEnglish-
dc.subjectNDRO-
dc.titleCharacteristics of SrBi//2Ta//2O//9/thin oxide/Si structure for non-destructive read out-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation9th int. metting on ferroelectricity, pp.147-
dc.citation.title9th int. metting on ferroelectricity-
dc.citation.startPage147-
dc.citation.endPage147-
dc.citation.conferencePlaceKO-
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