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Characteristics of SrBi//2Ta//2O//9/thin oxide/Si structure for non-destructive read out

Authors

Kim Yong Tae; Ho Nyung Lee; 임명호; 조성호

Citation

9th int. metting on ferroelectricity, pp.147

Keywords

NDRO

URI

https://pubs.kist.re.kr/handle/201004/110697

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KIST Conference Paper > Others

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